Stochastic Finite Element Modeling in Electronic Packaging

Liu Chu

• Publisher: Wiley-IEEE Press
• Year: 2026
• Print ISBN: 9781394352944
• eBook ISBN: 9781394352951
• Edition: 1
• Topic: Mathematics
• Subtopic: Probability & Statistics
• Index: Mathematics

An expert integration of digital twin technology and advanced simulation methods for the design and optimization of electronic packaging systems

In Stochastic Finite Element Modeling in Electronic Packaging, distinguished researcher Liu Chu delivers an expert discussion of the latest advanced numerical methods and modeling techniques specific to electronic packaging. The book supplements its explanations with original MATLAB and ANSYS (APDL) code that can be applied immediately. It also includes robust examples that draw on a comprehensive description of the mechanics of electronic packaging modeling.

Chu explains the fundamentals of modeling logic and concepts in an accessible way that is ideal for beginners to the topic. She demonstrates practical guides and benchmarks that will assist readers in the testing, measurement, and modeling of their own materials.

Readers will also find:

• A thorough introduction to a modeling approach that focuses on digital twins and big data applications, including Monte Carlo Sampling
• Comprehensive explorations of benchmarks, testing, measurement, and modeling
• Practical discussions of theoretical finite element models in electronic packaging
• Complete treatments of the fundamentals of modeling logic and concepts

Perfect for undergraduate and graduate students in electrical engineering and computer science, Stochastic Finite Element Modeling in Electronic Packaging will also benefit practicing electronic design engineers and academic researchers with an interest in electronic packaging and materials science.

Table of contents

• Cover
• Table of Contents
• Title Page
• Copyright
• About the Author
• Preface
• 1 Overview
• 2 Electronic Packaging
• 3 Random Sampling Methods
• 4 Random Fields and Stochastic Processes
• 5 Reliability Prediction
• 6 Finite Element Method
• 7 Nonlinear Stochastic Finite Element Method
• 8 Random Shear Stress and Thermal Temperature
• 9 Material Uncertainty in Electromigration
• 10 Mechanical Reliability in the Replaceable Integrated Chiplet Assembly
• 11 Kriging Surrogate Model
• 12 Digital Twins Based on SFEM
• Appendix
• Index
• End User License Agreement