
Electrical Modeling and Design for 3D System Integration
3D Integrated Circuits and Packaging, Signal Integrity, Power Integrity and EMC
- English
- ePUB (mobile friendly)
- Available on iOS & Android
Electrical Modeling and Design for 3D System Integration
3D Integrated Circuits and Packaging, Signal Integrity, Power Integrity and EMC
About this book
New advanced modeling methods for simulating the electromagnetic properties of complex three-dimensional electronic systems
Based on the author's extensive research, this book sets forth tested and proven electromagnetic modeling and simulation methods for analyzing signal and power integrity as well as electromagnetic interference in large complex electronic interconnects, multilayered package structures, integrated circuits, and printed circuit boards. Readers will discover the state of the technology in electronic package integration and printed circuit board simulation and modeling. In addition to popular full-wave electromagnetic computational methods, the book presents new, more sophisticated modeling methods, offering readers the most advanced tools for analyzing and designing large complex electronic structures.
Electrical Modeling and Design for 3D System Integration begins with a comprehensive review of current modeling and simulation methods for signal integrity, power integrity, and electromagnetic compatibility. Next, the book guides readers through:
-
The macromodeling technique used in the electrical and electromagnetic modeling and simulation of complex interconnects in three-dimensional integrated systems
-
The semi-analytical scattering matrix method based on the N-body scattering theory for modeling of three-dimensional electronic package and multilayered printed circuit boards with multiple vias
-
Two- and three-dimensional integral equation methods for the analysis of power distribution networks in three-dimensional package integrations
-
The physics-based algorithm for extracting the equivalent circuit of a complex power distribution network in three-dimensional integrated systems and printed circuit boards
-
An equivalent circuit model of through-silicon vias
-
Metal-oxide-semiconductor capacitance effects of through-silicon vias
Engineers, researchers, and students can turn to this book for the latest techniques and methods for the electrical modeling and design of electronic packaging, three-dimensional electronic integration, integrated circuits, and printed circuit boards.
Frequently asked questions
- Essential is ideal for learners and professionals who enjoy exploring a wide range of subjects. Access the Essential Library with 800,000+ trusted titles and best-sellers across business, personal growth, and the humanities. Includes unlimited reading time and Standard Read Aloud voice.
- Complete: Perfect for advanced learners and researchers needing full, unrestricted access. Unlock 1.4M+ books across hundreds of subjects, including academic and specialized titles. The Complete Plan also includes advanced features like Premium Read Aloud and Research Assistant.
Please note we cannot support devices running on iOS 13 and Android 7 or earlier. Learn more about using the app.
Information
Table of contents
- Cover
- IEEE Press
- Title page
- Copyright page
- Foreword
- Preface
- CHAPTER 1 Introduction
- CHAPTER 2 Macromodeling of Complex Interconnects in 3D Integration
- CHAPTER 3 2.5D Simulation Method for 3D Integrated Systems
- CHAPTER 4 Hybrid Integral Equation Modeling Methods for 3D Integration
- CHAPTER 5 Systematic Microwave Network Analysis for 3D Integrated Systems
- CHAPTER 6 Modeling of Through-Silicon Vias (TSV) in 3D Integration
- Index