Metrology and Diagnostic Techniques for Nanoelectronics
eBook - ePub

Metrology and Diagnostic Techniques for Nanoelectronics

  1. 1,454 pages
  2. English
  3. ePUB (mobile friendly)
  4. Available on iOS & Android
eBook - ePub

Metrology and Diagnostic Techniques for Nanoelectronics

About this book

Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore's law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

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Yes, you can access Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma, David G. Seiler, Zhiyong Ma,David G. Seiler in PDF and/or ePUB format, as well as other popular books in Physical Sciences & Biology. We have over one million books available in our catalogue for you to explore.

Information

Publisher
Jenny Stanford Publishing
Year
2017
Print ISBN
9789814745086
eBook ISBN
9781351733946
Edition
1
Topic
Physical Sciences
Subtopic
Biology

Table of contents

  1. Cover
  2. Half Title
  3. Title Page
  4. Copyright Page
  5. Table of Contents
  6. Preface
  7. Introduction
  8. Section 1 Characterization and Metrology for MOS Devices and Interconnects
  9. Section 2 Characterization Techniques for Novel Materials and Devices beyond CMOS
  10. Section 3 Electrical Characterization and Reliability Testing Techniques
  11. Section 4 Characterization and Metrology for 3D Stacked Die/ Package Interconnections
  12. Section 5 Circuit Diagnostic and Probing Techniques
  13. Index