
- 482 pages
- English
- ePUB (mobile friendly)
- Available on iOS & Android
About this book
Robust Design of Microelectronics Assemblies Against Mechanical Shock, Temperature and Moisture discusses how the reliability of packaging components is a prime concern to electronics manufacturers.The text presents a thorough review of this important field of research, providing users with a practical guide that discusses theoretical aspects, experimental results, and modeling techniques.The authors use their extensive experience to produce detailed chapters covering temperature, moisture, and mechanical shock induced failure, adhesive interconnects, and viscoelasticity. Useful program files and macros are also included.- Discusses how the reliability of packaging components is a prime concern to electronics manufacturers- Presents a thorough review of this important field of research, providing users with a practical guide that discusses theoretical aspects, experimental results, and modeling techniques- Includes program files and macros for additional study
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Information
Table of contents
- Cover image
- Title page
- Table of Contents
- Related titles
- Copyright
- Woodhead Publishing Series in Electronic and Optical Materials
- Foreword
- Preface
- 1. Introduction
- Part One. Advances in robust design against temperature-induced failures
- Part Two. Advances in robust design against moisture-induced failures
- Part Three. Robust design against drop impact
- Index