- 350 pages
- English
- PDF
- Available on iOS & Android
eBook - PDF
Principles of Semiconductor Network Testing
About this book
Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.
This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.
- Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
- Best new source of information for experienced semiconductor engineers as well as entry-level personnel
- Eight chapters about semiconductor testing
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Table of contents
- Front Cover
- Principles of Semiconductor Network Testing
- Copyright Page
- Contents
- Foreword
- Preface
- Chapter 1. Diode and Transistor Operation
- Chapter 2. Integrated Circuit Test Basics
- Chapter 3. Digital Logic Test
- Chapter 4. Noise Identification
- Chapter 5. Operational Amplifier
- Chapter 6. Data Acquisition Devices
- Chapter 7. Digital Signal Processing
- Chapter 8. CODEC (Coder/Decoder)
- Index
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Yes, you can access Principles of Semiconductor Network Testing by Amir Afshar in PDF and/or ePUB format, as well as other popular books in Sciences physiques & Théorie des quanta. We have over one million books available in our catalogue for you to explore.