- 434 pages
- English
- PDF
- Available on iOS & Android
eBook - PDF
Semiconductor Silicon Crystal Technology
About this book
Semiconductor Silicon Crystal Technology provides information pertinent to silicon, which is the dominant material in the semiconductor industry. This book discusses the technology of integrated circuits (ICs) in electronic materials manufacturer. Comprised of eight chapters, this book provides an overview of the basic science, silicon materials, IC device fabrication processes, and their interaction for enhancing both the processes and materials. This text then proceeds with a discussion of the atomic structure and bonding mechanisms in order to understand the nature and formation of crystal structures, which are the fundamentals of material science. Other chapters consider the technological crystallography and classify natural crystal morphologies based on observation. The final chapter deals with the interrelationships among silicon material characteristics, circuit design, and IC fabrication in order to ensure the fabrication of very-large-scale-integration/ultra-large-scale-integration circuits. This book is a valuable resource for graduate students, physicists, engineers, materials scientists, and professionals involved in semiconductor industry.
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Please note we cannot support devices running on iOS 13 and Android 7 or earlier. Learn more about using the app.
Yes, you can access Semiconductor Silicon Crystal Technology by Fumio Shimura in PDF and/or ePUB format, as well as other popular books in Technology & Engineering & Engineering General. We have over one million books available in our catalogue for you to explore.
Information
Table of contents
- Front Cover
- Semiconductor Silicon Crystal Technology
- Copyright Page
- Table of Contents
- Preface
- Chapter 1. Introduction
- Chapter 2. Atomic Structure and Chemical Bonds
- Chapter 3. Basic Crystallography
- Chapter 4. Basic Semiconductor Physics
- Chapter 5. Silicon Crystal Growth and Wafer Preparation
- Chapter 6. Crystal Characterization
- Chapter 7. Grown-In and Process-Induced Defects
- Chapter 8. Silicon Wafer Criteria for VLSI/ULSI Technology
- Appendixes
- Index