
- 462 pages
- English
- PDF
- Available on iOS & Android
Electron Probe Microanalysis
About this book
Electron Probe Microanalysis presents a collection of reviews on various aspects of electron probe microanalysis. This book discusses the model for quantitative electron probe analysis. Organized into 14 chapters, this book begins with an overview of the various kinds of microanalysis followed by a discussion of the advantages that can be derived from using the electron probe method. This text then examines the various applications of backscattered electron and specimen current methods for quantitative analysis. Other chapters consider the fundamental concepts for quantitative electron probe microanalysis utilizing pure elements as standards. This book discusses as well the absolute method of quantitative chemical analysis by emission X-ray spectroscopy. The final chapter deals with the main advantage of the Kossel technique in the study of the thermodynamic and mechanical characteristics of crystals. This book is a valuable resource for scientists and research workers. Non-specialists who need information on this excellent analytical tool will also find this book useful.
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Table of contents
- Front Cover
- Electron Probe Microanalysis
- Copyright Page
- Table of Contents
- LIST OF CONTRIBUTORS
- FOREWORD
- Chapter 1. Survey of MicroanalysisâInterpolation and Extrapolation
- Chapter 2. Behavior of Electrons in a Specimen
- Chapter 3. The Sandwich Sample Technique Applied to Quantitative Microprobe Analysis
- Chapter 4. Quantitative Microprobe Analysis: A Basis for Universal Atomic Number Correction Tables
- Chapter 5. Deconvolution: A Technique to Increase Electron Probe Resolution
- Chapter 6. Analysis for Low Atomic Number Elements with the Electron Microprobe
- Chapter 7. Changes in X-Ray Emission Spectra Observed between the Pure Elements and Elements in Combination with Others to Form Compounds or Alloys
- Chapter 8. Backscattered and Secondary Electron Emission as Ancillary Techniques in Electron Probe Analysis
- Chapter 9. The Influence of the Preparation of Metal Specimens on the Precision of Electron Probe Microanalysis
- Chapter 10. Electron Probe Microanalysis in Mineralogy
- Chapter 11. Electron Probe Analysis in Metallurgy
- Chapter 12. Scanning Electron Probe Measurement of Magnetic Fields
- Chapter 13. Nondispersive X-Ray Emission Analysis for Lunar Surface Geochemical Exploration
- Chapter 14. The Divergent Beam X-Ray Technique
- AUTHOR INDEX
- SUBJECT INDEX