eBook - PDF
Atomic Force Microscopy
Imaging, Measuring and Manipulating Surfaces at the Atomic Scale
- 270 pages
- English
- PDF
- Available on iOS & Android
eBook - PDF
Atomic Force Microscopy
Imaging, Measuring and Manipulating Surfaces at the Atomic Scale
About this book
With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
Frequently asked questions
Yes, you can cancel anytime from the Subscription tab in your account settings on the Perlego website. Your subscription will stay active until the end of your current billing period. Learn how to cancel your subscription.
At the moment all of our mobile-responsive ePub books are available to download via the app. Most of our PDFs are also available to download and we're working on making the final remaining ones downloadable now. Learn more here.
Perlego offers two plans: Essential and Complete
- Essential is ideal for learners and professionals who enjoy exploring a wide range of subjects. Access the Essential Library with 800,000+ trusted titles and best-sellers across business, personal growth, and the humanities. Includes unlimited reading time and Standard Read Aloud voice.
- Complete: Perfect for advanced learners and researchers needing full, unrestricted access. Unlock 1.4M+ books across hundreds of subjects, including academic and specialized titles. The Complete Plan also includes advanced features like Premium Read Aloud and Research Assistant.
We are an online textbook subscription service, where you can get access to an entire online library for less than the price of a single book per month. With over 1 million books across 1000+ topics, we’ve got you covered! Learn more here.
Look out for the read-aloud symbol on your next book to see if you can listen to it. The read-aloud tool reads text aloud for you, highlighting the text as it is being read. You can pause it, speed it up and slow it down. Learn more here.
Yes! You can use the Perlego app on both iOS or Android devices to read anytime, anywhere — even offline. Perfect for commutes or when you’re on the go.
Please note we cannot support devices running on iOS 13 and Android 7 or earlier. Learn more about using the app.
Please note we cannot support devices running on iOS 13 and Android 7 or earlier. Learn more about using the app.
Yes, you can access Atomic Force Microscopy by Victor Bellitto in PDF and/or ePUB format, as well as other popular books in Physical Sciences & Chemistry. We have over one million books available in our catalogue for you to explore.
Information
Table of contents
- Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale
- Contents
- Preface
- Chapter 1 Crystal Lattice Imaging Using Atomic Force Microscopy
- Chapter 2 Atomic Force Microscopy in Optical Imaging and Characterization
- Chapter 3 Magnetic Force Microscopy: Basic Principles and Applications
- Chapter 4 Vibration Responses of Atomic Force Microscope Cantilevers
- Chapter 5 Wavelet Transforms in Dynamic Atomic Force Spectroscopy
- Chapter 6 Nanoscale Effects of Friction, Adhesion and Electrical Conduction in AFM Experiments
- Chapter 7 Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications
- Chapter 8 Predicting Macroscale Effects Through Nanoscale Features
- Chapter 9 AFM Application in III-Nitride Materials and Devices
- Chapter 10 Atomic Force Microscopy to Characterize the Healing Potential of Asphaltic Materials
- Chapter 11 Atomic Force Microscopy – For Investigating Surface Treatment of Textile Fibers