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Machine Vision Inspection Systems, Machine Learning-Based Approaches
Machine Vision Inspection Systems, Machine Learning-Based Approaches

Machine Vision Inspection Systems, Machine Learning-Based Approaches

Muthukumaran Malarvel, Soumya Ranjan Nayak, Prasant Kumar Pattnaik, Surya Narayan Panda
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Machine Vision Inspection Systems, Machine Learning-Based Approaches

Muthukumaran Malarvel, Soumya Ranjan Nayak, Prasant Kumar Pattnaik, Surya Narayan Panda
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About This Book

Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes image processing, machine vision and, pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Now a day's the current research on machine inspection gained more popularity among various researchers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examining while inspection process.

This volume 2 covers machine learning-based approaches in MVIS applications and it can be employed to a wide diversity of problems particularly in Non-Destructive testing (NDT), presence/absence detection, defect/fault detection (weld, textile, tiles, wood, etc.,), automated vision test & measurement, pattern matching, optical character recognition & verification (OCR/OCV), natural language processing, medical diagnosis, etc. This edited book is designed to address various aspects of recent methodologies, concepts, and research plan out to the readers for giving more depth insights for perusing research on machine vision using machine learning-based approaches.


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Information

Publisher
Wiley
Year
2021
ISBN
9781119786108
Topic
Computer Science
Subtopic
Artificial Intelligence (AI) & Semantics
Edition
1

Table of contents