Applications and Metrology at Nanometer Scale 1
eBook - ePub

Applications and Metrology at Nanometer Scale 1

Smart Materials, Electromagnetic Waves and Uncertainties

  1. English
  2. ePUB (mobile friendly)
  3. Available on iOS & Android
eBook - ePub

Applications and Metrology at Nanometer Scale 1

Smart Materials, Electromagnetic Waves and Uncertainties

About this book

To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics.

This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications.

Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master?s students.

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Information

Publisher
Wiley-ISTE
Year
2021
Print ISBN
9781786306401
Edition
1
eBook ISBN
9781119808145

Table of contents

  1. Cover
  2. Table of Contents
  3. Title page
  4. Copyight
  5. Preface
  6. Introduction
  7. 1 Nanometer Scale
  8. 2 Statistical Tools to Reduce the Effect of Design Uncertainties
  9. 3 Electromagnetic Waves and Their Applications
  10. 4 Smart Materials
  11. Appendix: Propagation of a Light Ray
  12. References
  13. Index
  14. End User License Agreement

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Yes, you can access Applications and Metrology at Nanometer Scale 1 by Pierre-Richard Dahoo,Philippe Pougnet,Abdelkhalak El Hami,Pierre Richard Dahoo in PDF and/or ePUB format, as well as other popular books in Technology & Engineering & Materials Science. We have over 1.5 million books available in our catalogue for you to explore.