Applications and Metrology at Nanometer-Scale 2
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Applications and Metrology at Nanometer-Scale 2

Measurement Systems, Quantum Engineering and RBDO Method

Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

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eBook - ePub

Applications and Metrology at Nanometer-Scale 2

Measurement Systems, Quantum Engineering and RBDO Method

Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

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About This Book

Nanoscience, nanotechnologies and the laws of quantum physics are sources of disruptive innovation that open up new fields of application. Quantum engineering enables the development of very sensitive materials, sensor measurement systems and computers. Quantum computing, which is based on two-level systems, makes it possible to manufacture computers with high computational power.

This book provides essential knowledge and culminates with an industrial application of quantum engineering and nanotechnologies. It presents optical systems for measuring at the nanoscale, as well as quantum physics models that describe how a two-state system interacts with its environment. The concept of spin and its derivation from the Dirac equation is also explored, while theoretical foundations and example applications aid in understanding how a quantum gate works. Application of the reliability-based design optimization (RBDO) method of mechanical structures is implemented, in order to ensure reliability of estimates from the measurement of mechanical properties of carbon nanotube structures.

This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Masters students.

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Information

Publisher
Wiley-ISTE
Year
2021
ISBN
9781119818977
Edition
1

1
Measurement Systems Using Polarized Light

The Maxwell equations represent the physical phenomenon of light as an electromagnetic field which includes an electric field component and a magnetic field component oscillating in phase quadrature in a plane perpendicular to the direction of the light wave propagation. Photon wave–particle duality makes it possible to present both particle-like and wave-like behaviors. Interference is a phenomenon which is explained by the wave-like behavior of light. The wave-like properties of light and interference make it possible to study a number of physical phenomena, such as diffraction, interferometry, ellipsometry or holography. This approach has led to the development of innovative instruments using light–matter interaction and to various measuring systems. Mathematical approaches based on matrices are often used to calculate the effects of interference. These approaches use software such as MATLAB, MAPLE or computer programs written in Python, C language or Fortran. The finite element method can also be applied to design the instruments and simulate the expected observations.

1.1. Introduction

Chapters 3–6 of [DAH 16] present the theoretical characteristics of light. Light has dual properties; it is both a particle and a wave which is true also in the context of light–matter interaction. This chapter concentrates on applications through exercises or analysis of results of studies on the use of techniques using interference to study matter and materials.
The wave–particle duality in the case of a given particle (electron diffraction, neutron diffraction, etc.) is linked to the equation of L. de Broglie (1924) which relates the wavelength to the quantity of movement: λ = h/p, where p = mv, v being the speed and m the mass at rest. For a relativistic particle, with a speed close to that of light, the energy (E) o...

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