Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling
eBook - PDF

Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling

A Festschrift for Peter Heymann

  1. 131 pages
  2. English
  3. PDF
  4. Available on iOS & Android
eBook - PDF

Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling

A Festschrift for Peter Heymann

About this book

This third volume of the Forschungsberichte presents a collection of nine technical papers on selected topics of microwave engineering, ranging from investigations of the plasma in a Tokamak to the modeling of Heterojunction Bipolar Transistors. The main focus, however, is on noise in transistors and circuits, and how to measure it. Eight of the contributions are original papers, and one is a reprint from Plasma Phys. Control. Fusion, it appears by courtesy of the Institute of Physics Publishing.

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Information

Year
2005
eBook ISBN
9783736913288
Print ISBN
9783865373281
Edition
1

Table of contents