
- 128 pages
- English
- ePUB (mobile friendly)
- Available on iOS & Android
eBook - ePub
About this book
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
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Yes, you can access Failure Analysis by Daniel J. D. Sullivan,Eric J. Carleton in PDF and/or ePUB format, as well as other popular books in Technology & Engineering & Analytic Chemistry. We have over one million books available in our catalogue for you to explore.
Information
Table of contents
- Title Page
- Copyright
- Contents
- Chapter 1âIntroduction to FA
- Chapter 2âWhy is FA important?
- Chapter 3âPlanning out an FA
- Chapter 4âTypical types of failure mechanisms
- Chapter 5âDestructive versus nondestructive analysis
- Chapter 6âOptical Microscopy (OM)
- Chapter 7âScanning Acoustic Microscopy/Tomography (SAM or SAT)
- Chapter 8âX-ray imaging (2D and 3D)
- Chapter 9âTime Domain Reflectometry (TDR)
- Chapter 10âSelecting the path before destructive analysis begins
- Chapter 11âDestructive work
- Chapter 12âElectrical Failure Analysis (EFA)
- Chapter 13âEMMI/OBIRCH/IR
- Chapter 14âCross sections (X-sections)
- Chapter 15âParallel lapping (p-lap)
- Chapter 16âFocused Ion Beam (FIB)
- Chapter 17âScanning Electron Microscopy (SEM)
- Chapter 18âTransmission Electron Microscopy (TEM)
- Chapter 19âEnergy Dispersive X-ray spectroscopy (EDX)
- Chapter 20âUse of additional materials analytical techniques and processes
- Chapter 21âHow should these results be used?
- Index