Advanced Materials Characterization
eBook - ePub

Advanced Materials Characterization

Basic Principles, Novel Applications, and Future Directions

  1. 130 pages
  2. English
  3. ePUB (mobile friendly)
  4. Available on iOS & Android
eBook - ePub

Advanced Materials Characterization

Basic Principles, Novel Applications, and Future Directions

About this book

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

Features:

  • Covers material characterization techniques and the development of advanced characterization technology
  • Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
  • Discusses advanced material characterization technology in the microstructural and property characterization fields
  • Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
  • Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies

This book is aimed at graduate students and researchers in materials science and engineering.

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Yes, you can access Advanced Materials Characterization by Ch Sateesh Kumar,M. Muralidhar Singh,Ram Krishna in PDF and/or ePUB format, as well as other popular books in Technology & Engineering & Electrical Engineering & Telecommunications. We have over one million books available in our catalogue for you to explore.

Table of contents

  1. Cover
  2. Half Title
  3. Series Page
  4. Title Page
  5. Copyright Page
  6. Table of Contents
  7. Preface
  8. Acknowledgments
  9. About the Authors
  10. Introduction
  11. 1 Introduction to Material Characterization
  12. 2 X-Ray Diffraction (XRD)
  13. 3 Nanomechanical System
  14. 4 X-Ray Photo Spectroscopy (XPS)
  15. 5 Scanning Electron Microscope (SEM)
  16. 6 Field Emission Scanning Electron Microscope (FESEM)
  17. 7 Transmission Electron Microscope (TEM)
  18. 8 Atomic Force Microscope (AFM)
  19. 9 Near-Field Scanning Optical Microscope Raman
  20. 10 Optical Characterization Instruments
  21. 11 Synchrotron Techniques
  22. 12 Other Advanced Instruments Used for Characterization of Functionally Graded Materials