Surface Structure Determination by LEED and X-rays

Wolfgang Moritz, Michel A. Van Hove

• Publisher: Cambridge University Press
• Year: 2022
• Print ISBN:
  9781108418096
• eBook ISBN:
  9781108307710
• Topic: Technology & Engineering
• Subtopic: Electrical Engineering & Telecommunications
• Index: Technology & Engineering

This timely text covers the theory and practice of surface and nanostructure determination by low-energy electron diffraction (LEED) and surface X-ray diffraction (SXRD): it is the first book on such quantitative structure analysis in over 30 years. It provides a detailed description of the theory, including cutting-edge developments and tested experimental methods. The focus is on quantitative techniques, while the qualitative interpretation of the LEED pattern without quantitative I(V) analysis is also included. Topics covered include the future study of nanoparticles, quasicrystals, thermal parameters, disorder and modulations of surfaces with LEED, with introductory sections enabling the non-specialist to follow all the concepts and applications discussed. With numerous colour figures throughout, this text is ideal for undergraduate and graduate students and researchers, whether experimentalists or theorists, in the fields of surface science, nanoscience and related technologies. It can serve as a textbook for graduate-level courses of one or two semesters.

Table of contents

• Cover
• Half-title
• Title page
• Copyright information
• Contents
• Preface
• List of Abbreviations
• List of Major Symbols
• Glossary
• 1 Introduction
• 2 Basic Elements
• 3 LEED Experiment
• 4 Interpretation of the Diffraction Pattern
• 5 LEED Theory: Basic Formalisms
• 6 LEED Theory: Applications
• 7 Surface X-ray Diffraction
• Appendix A Lists of Books Related to Surface Science
• Appendix B Lists of Surface Science Websites, LEED Codes and Related Data
• Appendix C Vector Calculation in Oblique Lattices
• Appendix D Distance between Neighbouring Lattice Planes in the Bravais Lattices
• Appendix E Lattice Transformations
• Appendix F Calculation of Translation Vectors for Stepped Surfaces
• Appendix G Symmetry Use in the Calculation of Reflection and Transmission Matrices
• Appendix H Symmetry Use in Tensor LEED
• Appendix I Atomic Displacement Parameters
• Appendix J Averaging over Domains
• References
• Index