
- English
- PDF
- Available on iOS & Android
About this book
Comprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces
Surface and Interface Analysis is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schrödinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to transform theoretical knowledge into applied skills through a Maieutic pedagogical approach.
Written by a highly qualified professor, Surface and Interface Analysis: Principles and Applications includes information on:
- Relationship between atomic and molecular orbitals and compositional analysis principles based on measurements of photoelectrons, Auger electrons, X-rays, and secondary ions emitted from the surface
- Governance of electromagnetic wave propagation in a dielectric medium and what can be learned from analyzing the electromagnetic wave reflected from the interface
- Surface metrology using light reflection (non-contact) and scanning probe (contact) and analysis of mechanical properties through indentation
- Artifacts and misinterpretations that may be encountered during analysis
Surface and Interface Analysis is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses.
Frequently asked questions
- Essential is ideal for learners and professionals who enjoy exploring a wide range of subjects. Access the Essential Library with 800,000+ trusted titles and best-sellers across business, personal growth, and the humanities. Includes unlimited reading time and Standard Read Aloud voice.
- Complete: Perfect for advanced learners and researchers needing full, unrestricted access. Unlock 1.4M+ books across hundreds of subjects, including academic and specialized titles. The Complete Plan also includes advanced features like Premium Read Aloud and Research Assistant.
Please note we cannot support devices running on iOS 13 and Android 7 or earlier. Learn more about using the app.
Information
Table of contents
- Cover
- Title Page
- Copyright Page
- Contents
- Preface
- About the Companion Website
- Chapter 1 Introduction
- Chapter 2 Elemental Analysis via X-ray Irradiation
- Chapter 3 Elemental Analysis via Electron Irradiation
- Chapter 4 Elemental Analysis via Ion Irradiation
- Chapter 5 Light Propagation, Absorption, and Reflection
- Chapter 6 Spectroscopic Analysis via IR Reflection and Transmission
- Chapter 7 Buried Interface Analysis via Nonlinear Spectroscopy
- Chapter 8 Multivariate Data Analysis
- Chapter 9 Thin Film Analysis via Reflectometry and Ellipsometry
- Chapter 10 Topography Analysis via Light Reflection
- Chapter 11 Topography Analysis via Scanning Probe
- Chapter 12 Mechanical Analysis via Indentation
- Index
- EULA