Engineer's Guide to Automated Testing of High-Speed Interfaces, Second Edition
eBook - PDF

Engineer's Guide to Automated Testing of High-Speed Interfaces, Second Edition

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  1. 706 pages
  2. English
  3. PDF
  4. Available on iOS & Android
eBook - PDF

Engineer's Guide to Automated Testing of High-Speed Interfaces, Second Edition

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About this book

This second edition of An Engineer's Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing.

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Table of contents

  1. Contents
  2. Preface to the Second Edition
  3. Preface to the First Edition
  4. 1 Introduction
  5. 2 High-Speed Digital Basics
  6. 3 High-Speed Interface Standards
  7. 4 ATE Instrumentation for Digital Applications
  8. 5 Tests and Measurements
  9. 6 Production Testing
  10. 7 Support Instrumentation
  11. 8 Test Fixture Design
  12. 9 Advanced ATE Topics
  13. A Introduction to the Gaussian Distribution and Analytical Computation of the BER
  14. B The Dual Dirac Model and RJ/DJ Separation
  15. C Pseudo-Random Bit Sequences and Other Data Patterns
  16. D Coding, Scrambling, Disparity, and CRC
  17. E Time-Domain Reflectometry and Time-Domain Transmission (TDR/TDT)
  18. F S-Parameters
  19. G Engineering CAD Tools
  20. H Test Fixture Evaluation and Characterization
  21. I Jitter Injection Calibration
  22. J Phase Noise, RMS Jitter, and Random Jitter
  23. About the Authors
  24. Index