The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Contents:
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- Introduction (N Tanaka)
- Historical Survey of the Development of STEM Instruments (N Tanaka)
- Basic Knowledge of STEM:
- Basics of STEM (N Tanaka and K Saitoh)
- Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)
- Theories of STEM Imaging:
- Theory for HAADF-STEM and Its Image Simulation (K Watanabe)
- Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)
- Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)
- Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)
- Advanced Methods in STEM:
- Aberration Correction in STEM (H Sawada)
- Secondary Electron Microscopy in STEM (H Inada and Y Zhu)
- Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)
- Electron Tomography in STEM (N Tanaka)
- Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)
- Recent Topics and Future Prospects in STEM (N Tanaka)
Readership: Graduate students and researchers in the field of nanomaterials and nanostructures. - Key Features:
- Most advanced; befitting beginning graduate students
- Very convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application details
- Spans from the basic theory to the applications of STEM