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eBook - ePub
About this book
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.
To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.
With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.
With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
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Yes, you can access Conductive Atomic Force Microscopy by Mario Lanza in PDF and/or ePUB format, as well as other popular books in Physical Sciences & Chemistry. We have over one million books available in our catalogue for you to explore.
Information
Table of contents
- Cover
- Title Page
- Copyright
- Table of Contents
- Oxide Films and Conduction AFM
- List of Contributors
- Chapter 1: History and Status of the CAFM
- Chapter 2: Fabrication and Reliability of Conductive AFM Probes
- Chapter 3: Fundamentals of CAFM Operation Modes
- Chapter 4: Investigation of High-k Dielectric Stacks by C-AFM: Advantages, Limitations, and Possible Applications
- Chapter 5: Characterization of Grain Boundaries in Polycrystalline HfO2 Dielectrics
- Chapter 6: CAFM Studies on Individual GeSi Quantum Dots and Quantum Rings
- Chapter 7: Conductive Atomic Force Microscopy of Two-Dimensional Electron Systems: From AlGaN/GaN Heterostructures to Graphene and MoS2
- Chapter 8: Nanoscale Three-Dimensional Characterization with Scalpel SPM
- Chapter 9: Conductive Atomic Force Microscopy for Nanolithography Based on Local Anodic Oxidation
- Chapter 10: Combination of Semiconductor Parameter Analyzer and Conductive Atomic Force Microscope for Advanced Nanoelectronic Characterization
- Chapter 11: Design and Fabrication of a Logarithmic Amplifier for Scanning Probe Microscopes to Allow Wide-Range Current Measurements
- Chapter 12: Enhanced Current Dynamic Range Using ResiScopeā¢ and Soft-ResiScopeā¢ AFM Modes
- Chapter 13: Multiprobe Electrical Measurements without Optical Interference
- Chapter 14: KPFM and its Use to Characterize the CPD in Different Materials
- Chapter 15: Hot Electron Nanoscopy and Spectroscopy (HENs)
- Index
- End User License Agreement