
Fringe Pattern Analysis for Optical Metrology
Theory, Algorithms, and Applications
- English
- ePUB (mobile friendly)
- Available on iOS & Android
Fringe Pattern Analysis for Optical Metrology
Theory, Algorithms, and Applications
About this book
Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
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Information
Table of contents
- Cover
- Related Titles
- Title Page
- Copyright
- Preface
- List of Symbols and Acronyms
- Chapter 1: Digital Linear Systems
- Chapter 2: Synchronous Temporal Interferometry
- Chapter 3: Asynchronous Temporal Interferometry
- Chapter 4: Spatial Methods with Carrier
- Chapter 5: Spatial Methods Without Carrier
- Chapter 6: Phase Unwrapping
- Appendix A List of Linear Phase-Shifting Algorithms (PSAs)
- References
- Index
- End User License Agreement