Applying the Rasch Model and Structural Equation Modeling to Higher Education

The Technology Satisfaction Model

A.Y.M. Atiquil Islam

• Éditeur: Chapman and Hall/CRC
• Année: 2023
• ISBN:
  9781000890761
• Édition: 1
• Sujet: Bildung
• Sous-sujet: Bildungsverwaltung

This book introduces the fundamentals of the technology satisfaction model (TSM), supporting readers in applying the Rasch model and structural equation modeling (SEM) – a multivariate technique – to higher education (HE) research. User satisfaction is traditionally measured along a single dimension. However, the TSM includes digital technologies for teaching, learning and research across three dimensions: computer efficacy, perceived ease of use and perceived usefulness. Establishing relationships among these factors is a challenge. Although commonly used in psychology to trace relationships, Rasch and SEM approaches are rarely used in educational technology or library and information science. This book, therefore, shows that combining these two analytical tools offers researchers better options for measurement and generalisation in HE research. This title presents theoretical and methodological insights of use to researchers in HE.