Reliability, Robustness and Failure Mechanisms of LED Devices

Methodology and Evaluation

Yannick Deshayes, Laurent Bechou

• Publisher: ISTE Press - Elsevier
• Year: 2017
• Print ISBN: 9781785481529
• eBook ISBN: 9780081010884
• Topic: Technology & Engineering
• Subtopic: Civil Engineering
• Index: Technology & Engineering

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.- Deals exclusively with reliability, based on the physics of failure for infrared LEDs- Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications- Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution- Focuses on the method to extract fundamental parameters from electrical and optical characterizations

1

State-of-the-Art of Infrared Technology

Abstract

Optoelectronic technologies have appeared on the market in the recent years. They started by replacing the copper wired telecommunications networks. In addition, they are in competition with integrated electronic technologies, particularly at the level of interconnection. The transmission capacity through optical fiber increases a likelihood of improved performance, which cannot be foreseen in electronics. However, the field of optoelectronics techniques is still in the development stage. Furthermore, two essential problems arise:

– the manufacturing cost of optical technologies is higher than that of conventional electronic systems, especially for the treatment of data in embedded systems;

– the reliability of optoelectronic systems is difficult to understand. Their complexity (chip and assembly) makes the study and analysis of failures more difficult. It becomes imperative to consider these two essential problems to comprehend the optical alignment for the assembly and the drifts of the electrooptical parameters of the chip.

Keywords

Absorption; Autofocus; Compound materials III-V; Epitaxial structures; Infrared Technology; LED assembly; Light-emitting diodes; Optical susceptibility; Space; Spontaneous emission; Ternary and quaternary compounds

1.1 Introduction

Optoelectronic technologies have appeared on the market in the recent years. They started by replacing the copper wired telecommunications networks. In addition, they are in competition with integrated electronic technologies, particularly at the level of interconnection. The transmission capacity through optical fiber increases a likelihood of improved performance, which cannot be foreseen in electronics. However, the field of optoelectronics techniques is still in the development stage. Furthermore, two essential problems arise:

– the manufacturing cost of optical technologies is higher than that of conventional electronic systems, especially for the treatment of data in embedded systems;

– the reliability of optoelectronic systems is difficult to understand. Their complexity (chip and assembly) makes the study and analysis of failures more difficult. It becomes imperative to consider these two essential problems to comprehend the optical alignment for the assembly and the drifts of the electrooptical parameters of the chip.

This chapter will focus on the second problem: the evaluation and identification of degraded areas on a light emitting diode (LED). The main ch...

Table of contents

• Cover image
• Title page
• Table of Contents
• Copyright
• Preface
• 1: State-of-the-Art of Infrared Technology
• 2: Analysis and Models of an LED
• 3: Physics of Failure Principles
• 4: Methodologies of Reliability Analysis
• Bibliography
• Index